Welcome to Failure Analysis / Material Characterization Lab
Our lab providing failure analysis / material characterization services.
Type of material / samples that commonly sent over to do material characterization / inspecting impurities or defect / to check material composition / chemical compound:
List of our equipment/capabilities are:
1. Variable Pressure Scanning Electron Microscope (VP-SEM)
2. Field-emission Scanning Electron Microscope (FE-SEM)
3. Energy-dispersive X-Ray Spectroscopy (EDX/EDS)
4. Atomic Force Microscope (AFM)
5. Hi Optical Microscope
6. Fourier Transform Infra-red (FTIR)
7. Ion-milling
8. Sample preparation for SEM/optical microscope:
a) Cross-section (mounting, grinding, polishing)
b) Critical Point Drying (CPD)
Type of material / samples that commonly sent over to do material characterization / inspecting impurities or defect / to check material composition / chemical compound:
- Electronic & Semiconductor parts
- Metal
- Composite
- Fiber optics
- Biological samples
and many more.
For more info: refer to Contact
